File:Stylus Instrument.svg
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Size of this PNG preview of this SVG file: 554 × 318 pixels. Other resolutions: 320 × 184 pixels | 640 × 367 pixels | 800 × 459 pixels | 1,024 × 588 pixels | 1,280 × 735 pixels.
Original file (SVG file, nominally 554 × 318 pixels, file size: 23 KB)
Summary[edit]
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Deutsch: Prinzip eines Tastschnittgerätes (auch für die Erläuterung eines Rasterkraftmikroskopes geeignet): Ein Hebel (1) hält eine kleine Spitze (2), die horizontal (3) über die Objektoberfläche (5) gezogen wird. Während die Spitze dem Profil folgt, bewegt sich der Ausleger vertikal (4). Die Vertikalposition wird als hellgrün dargestelltes Profil (6) aufgezeichnet.
English: Principle of a stylus instrument profilometer (also suitable for an atomic force microscope, AFM): A cantilever (1) is holding a small tip (2) that is sliding along the horizontal direction (3) over the object's surface (5). Following the profile the cantilever is moving vertically (4). The vertical position is recorded as the measured profile (6) shown in light green.
Français : Principe de fonctionnement d'un profilomètre de contact (le microscope à force atomique est basé sur un principe comparable). Un levier (1) porte une pointe (2) qui glisse horizontalement (3) le long de la surface à analyser (5). En fonction du profil parcouru, le levier est soumis à un mouvement vertical (4). Ce mouvement permet d'enregistrer le profil ainsi mesuré (6, en vert clair), avec un précision déterminée par la forme du stylet.
Русский: Консоль (1) держит иглу (2), которая перемещается горизонтально в направлении (3) над поверхностью объекта (5). Движение иглы повторяет основные неровности профиля и соответственно двигает консоль вертикально. Вертикальная позиция (4) записывается как измеренный профиль поверхности (6)(светло-зелёная линия).
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| Source | Own work |
| Author | Dr. Schorsch |
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This image has been assessed under the valued image criteria and is considered the most valued image on Commons within the scope: Principle of a tactile profilometer. You can see its nomination here. |
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Licensing[edit]
I, the copyright holder of this work, hereby publish it under the following licenses:
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Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation License, Version 1.2 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts. A copy of the license is included in the section entitled GNU Free Documentation License. |
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This file is licensed under the Creative Commons Attribution-Share Alike 3.0 Unported, 2.5 Generic, 2.0 Generic and 1.0 Generic license. | |
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| Annotations | This image is annotated: View the annotations at Commons |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
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| current | 09:29, 8 August 2008 | | 554 × 318 (23 KB) | Xorx (talk | contribs) | {{Information |Description={{en|1=Principle of a stylus instrument profilometer (also suitable for an atomic force microscope, AFM): A cantilever (1) is holding a small tip (2) that is sliding along the horizontal direction (3) over the object's surface ( |
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